1function test = g_test_measure(test)
2
3% SPDX-License-Identifier: BSD-3-Clause
4% Copyright(c) 2017 Intel Corporation. All rights reserved.
5% Author: Seppo Ingalsuo <seppo.ingalsuo@linux.intel.com>
6
7%% Reference: AES17 6.2.2 Gain
8%  http://www.aes.org/publications/standards/
9
10default_result = NaN * ones(1,length(test.ch));
11test.g_db = default_result;
12
13%% Load output file
14[x, nx] = load_test_output(test);
15
16if nx == 0
17	test.fail = 1;
18	return
19end
20
21%% Standard low-pass
22y0 = stdlpf(x, test.fu, test.fs);
23
24%% Find sync
25[d, nt, nt_use, nt_skip] = find_test_signal(y0, test);
26if isempty(d)
27	test.fail = 1;
28	return
29end
30
31%% Trim sample by removing first 1s to let the notch to apply
32i1 = d+nt_skip;
33i2 = i1+nt_use-1;
34y = y0(i1:i2, :);
35
36%% Gain, SNR
37level_in = test.a_db;
38level_out = level_dbfs(y);
39test.g_db = level_out - level_in + test.att_rec_db;
40for i = 1:length(test.g_db)
41	fprintf('Gain = %6.3f dB (expect %6.3f dB)\n', test.g_db(i), test.g_db_expect(i));
42end
43
44%% Check pass/fail
45test.fail = 0;
46delta_abs = abs(test.g_db_expect - test.g_db);
47idx = find(delta_abs >  test.g_db_tol);
48for i = 1:length(idx)
49	fprintf('Failed ch%d gain %f dB (max %f dB)\n', test.ch(i), test.g_db(i), test.g_db_tol);
50	test.fail = 1;
51end
52
53end
54