Searched refs:laneToTest (Results 1 – 1 of 1) sorted by relevance
3473 uint8_t laneToTest; in write_calibration_using_mtc() local3501 for (laneToTest = 0x00U; laneToTest<number_of_lanes_to_calibrate;\ in write_calibration_using_mtc()3502 laneToTest++) in write_calibration_using_mtc()3508 uint8_t mask = (uint8_t)(1U<<laneToTest); in write_calibration_using_mtc()3522 if((calib_data.write_cal.status_lower & (0x01U<<laneToTest)) \ in write_calibration_using_mtc()3525 calib_data.write_cal.lower[laneToTest] = (cal_data & 0xFU); in write_calibration_using_mtc()3526 calib_data.write_cal.status_lower |= (0x01U<<laneToTest); in write_calibration_using_mtc()3532 (void)uprint32(g_debug_uart, "\n\rLane passed:",laneToTest); in write_calibration_using_mtc()3556 (void)uprint32(g_debug_uart, "\n\rLane failed:",laneToTest); in write_calibration_using_mtc()3650 uint8_t laneToTest, result = 0U; in FPGA_VREFDQ_calibration_using_mtc() local[all …]
