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Searched refs:TEST (Results 1 – 2 of 2) sorted by relevance

/hal_microchip-latest/pic32c/pic32cxsg/include/fixups/component/
Dcan_component_fixup_pic32cxsg.h329 uint32_t TEST:1; /*!< bit: 7 Test Mode Enable */ member
1302 __IO CAN_TEST_Type TEST; /**< \brief Offset: 0x10 (R/W 32) Test */ member
/hal_microchip-latest/mec/
DMCHP_MEC1701.h263 …__IO uint32_t TEST : 1; /*!< [2..2] Test bit … member
295 …__IO uint32_t TEST : 8; /*!< [0..7] Test bits … member
8254 …__IO uint8_t TEST : 1; /*!< [0..0] Test Bit. … member
25045 …__IO uint32_t TEST : 1; /*!< [2..2] TEST … member
25196 …__I uint32_t TEST : 1; /*!< [4..4] Test … member
26550 …__IO uint32_t TEST : 1; /*!< [6..6] Must be always written with 0. … member
26648 …__I uint8_t TEST; /*!< (@ 0x4000403C) Test … member
26651 …__IO uint8_t TEST : 8; /*!< [0..7] This register must not be written, or un… member
27997 …__IO uint8_t TEST : 1; /*!< [3..3] Test … member
28174 …__IO uint32_t TEST : 1; /*!< [0..0] Test … member