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Searched refs:TEST (Results 1 – 9 of 9) sorted by relevance

/hal_atmel-3.5.0-3.4.0/asf/sam0/include/samd51/component/
Dcan.h232 uint32_t TEST:1; /*!< bit: 7 Test Mode Enable */ member
3053 __IO CAN_TEST_Type TEST; /**< \brief Offset: 0x10 (R/W 32) Test */ member
/hal_atmel-3.5.0-3.4.0/asf/sam0/include/same51/component/
Dcan.h218 uint32_t TEST:1; /*!< bit: 7 Test Mode Enable */ member
3039 __IO CAN_TEST_Type TEST; /**< \brief Offset: 0x10 (R/W 32) Test */ member
/hal_atmel-3.5.0-3.4.0/asf/sam0/include/samc21/component/
Dcan.h218 uint32_t TEST:1; /*!< bit: 7 Test Mode Enable */ member
3039 __IO CAN_TEST_Type TEST; /**< \brief Offset: 0x10 (R/W 32) Test */ member
/hal_atmel-3.5.0-3.4.0/asf/sam0/include/same54/component/
Dcan.h218 uint32_t TEST:1; /*!< bit: 7 Test Mode Enable */ member
3039 __IO CAN_TEST_Type TEST; /**< \brief Offset: 0x10 (R/W 32) Test */ member
/hal_atmel-3.5.0-3.4.0/asf/sam0/include/samc21n/component/
Dcan.h218 uint32_t TEST:1; /*!< bit: 7 Test Mode Enable */ member
3039 __IO CAN_TEST_Type TEST; /**< \brief Offset: 0x10 (R/W 32) Test */ member
/hal_atmel-3.5.0-3.4.0/asf/sam/include/same70/component/
Dmcan.h204 …uint32_t TEST:1; /**< bit: 7 Test Mode Enable (read/write, write protecti… member
/hal_atmel-3.5.0-3.4.0/asf/sam/include/samv71/component/
Dmcan.h266 …uint32_t TEST:1; /**< bit: 7 Test Mode Enable (read/write, write protecti… member
/hal_atmel-3.5.0-3.4.0/asf/sam/include/samv71b/component/
Dmcan.h895 …uint32_t TEST:1; /**< bit: 7 Test Mode Enable (read/write, write protecti… member
/hal_atmel-3.5.0-3.4.0/asf/sam/include/same70b/component/
Dmcan.h895 …uint32_t TEST:1; /**< bit: 7 Test Mode Enable (read/write, write protecti… member