1 /* 2 * Copyright (c) 2018 Nordic Semiconductor ASA 3 * Copyright (c) 2015 Runtime Inc 4 * 5 * SPDX-License-Identifier: Apache-2.0 6 */ 7 8 #ifndef _SETTINGS_TEST_FCB_H 9 #define _SETTINGS_TEST_FCB_H 10 11 #include <stdio.h> 12 #include <string.h> 13 #include <zephyr/ztest.h> 14 15 #include <zephyr/settings/settings.h> 16 #include <zephyr/storage/flash_map.h> 17 18 #ifdef __cplusplus 19 extern "C" { 20 #endif 21 22 #define SETTINGS_TEST_FCB_VAL_STR_CNT 64 23 #define SETTINGS_TEST_FCB_FLASH_CNT 4 24 25 26 extern uint8_t val8; 27 extern uint8_t val8_un; 28 extern uint32_t val32; 29 extern uint64_t val64; 30 31 extern int test_get_called; 32 extern int test_set_called; 33 extern int test_commit_called; 34 extern int test_export_block; 35 36 extern int c2_var_count; 37 38 extern struct flash_sector fcb_sectors[SETTINGS_TEST_FCB_FLASH_CNT]; 39 40 extern char val_string[SETTINGS_TEST_FCB_VAL_STR_CNT][SETTINGS_MAX_VAL_LEN]; 41 extern char test_ref_value[SETTINGS_TEST_FCB_VAL_STR_CNT][SETTINGS_MAX_VAL_LEN]; 42 43 extern struct settings_handler c_test_handlers[]; 44 45 void ctest_clear_call_state(void); 46 int ctest_get_call_state(void); 47 48 void config_wipe_srcs(void); 49 void config_wipe_fcb(struct flash_sector *fs, int cnt); 50 51 void test_config_fill_area( 52 char test_value[SETTINGS_TEST_FCB_VAL_STR_CNT][SETTINGS_MAX_VAL_LEN], 53 int iteration); 54 55 void *settings_config_setup(void); 56 void settings_config_teardown(void *fixture); 57 void test_config_insert2(void); 58 void test_config_insert3(void); 59 int settings_unregister(struct settings_handler *handler); 60 #ifdef __cplusplus 61 } 62 #endif 63 #endif /* _SETTINGS_TEST_FCB_H */ 64