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Searched refs:flash_chip (Results 1 – 8 of 8) sorted by relevance

/hal_espressif-3.7.0/components/spi_flash/test_apps/esp_flash/main/
Dtest_esp_flash_drv.c230 TEST_ASSERT_NOT_EQUAL(NULL, test_part->flash_chip); in flash_test_core()
233 part.flash_chip = chip; in flash_test_core()
235 ESP_LOGI(TAG, "Testing chip %p, address 0x%08lX...", part.flash_chip, part.address); in flash_test_core()
242 ESP_LOGI(TAG, "Testing chip %p, address 0x%08lX...", part.flash_chip, part.address); in flash_test_core()
263 esp_flash_t* chip = part->flash_chip; in test_metadata()
276 esp_flash_t* chip = part->flash_chip; in erase_test_region()
305 esp_flash_t* chip = part->flash_chip; in test_simple_read_write()
336 esp_flash_t* chip = part->flash_chip; in test_unaligned_read_write()
357 esp_flash_t* chip = part->flash_chip; in test_single_read_write()
385 esp_flash_t* chip = part->flash_chip; in test_three_byte_read_write()
[all …]
/hal_espressif-3.7.0/components/spi_flash/test/
Dtest_esp_flash.c447 TEST_ASSERT_NOT_EQUAL(NULL, test_part->flash_chip); in flash_test_core()
450 part.flash_chip = chip; in flash_test_core()
452 ESP_LOGI(TAG, "Testing chip %p, address 0x%08X...", part.flash_chip, part.address); in flash_test_core()
459 ESP_LOGI(TAG, "Testing chip %p, address 0x%08X...", part.flash_chip, part.address); in flash_test_core()
506 esp_err_t err = esp_flash_erase_region(part->flash_chip, part->address, total_len); in measure_erase()
525 …esp_err_t err = esp_flash_write(part->flash_chip, data_to_write + offset, part->address + offset, … in measure_write()
547 …esp_err_t err = esp_flash_read(part->flash_chip, data_read + offset, part->address + offset, len_r… in measure_read()
593 esp_flash_t* chip = part->flash_chip; in test_flash_read_write_performance()
/hal_espressif-3.7.0/components/esp_mm/test_apps/mmap_hw/main/
Dtest_mmap_hw.c94 TEST_ESP_OK(esp_flash_erase_region(part->flash_chip, part->address, part->size));
101 TEST_ESP_OK(esp_flash_write(part->flash_chip, sector_buf, part->address, sizeof(sector_buf)));
150 TEST_ESP_OK(esp_flash_erase_region(part->flash_chip, part->address, part->size));
/hal_espressif-3.7.0/components/esp_hw_support/test_apps/mspi/main/
Dtest_flash_psram.c221 esp_flash_erase_region(part->flash_chip, part->address, part->size);
229 esp_flash_write(part->flash_chip, wr_buf, part->address, sizeof(wr_buf));
230 esp_flash_read(part->flash_chip, rd_buf, part->address, sizeof(rd_buf));
/hal_espressif-3.7.0/components/esp_mm/test_apps/mm/main/
Dtest_cache_msync.c187 TEST_ESP_OK(esp_flash_erase_region(part->flash_chip, part->address, part->size));
201 ESP_ERROR_CHECK(esp_flash_erase_region(part->flash_chip, part->address, part->size));
/hal_espressif-3.7.0/components/spi_flash/sim/stubs/spi_flash/
Desp_partition.h76 void* flash_chip; /*!< SPI flash chip on which the partition resides */ member
/hal_espressif-3.7.0/components/spi_flash/test_apps/esp_flash_stress/main/
Dtest_esp_flash_stress.c40 esp_flash_t *chip = test_ctx->part->flash_chip; in s_test_flash_ops_task()
/hal_espressif-3.7.0/components/esp_psram/test_apps/psram/main/
Dtest_psram.c89 TEST_ESP_OK(esp_flash_erase_region(part->flash_chip, part->address, part->size));