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Searched refs:test_value (Results 1 – 12 of 12) sorted by relevance

/Zephyr-latest/tests/lib/smf/src/
Dtest_lib_hierarchical_5_ancestor_smf.c66 static uint32_t test_value[] = { variable
120 zassert_equal(o->transition_bits, test_value[o->tv_idx], in p05_entry()
132 zassert_equal(o->transition_bits, test_value[o->tv_idx], in p05_run()
146 zassert_equal(o->transition_bits, test_value[o->tv_idx], in p05_exit()
158 zassert_equal(o->transition_bits, test_value[o->tv_idx], in p04_entry()
170 zassert_equal(o->transition_bits, test_value[o->tv_idx], in p04_run()
182 zassert_equal(o->transition_bits, test_value[o->tv_idx], in p04_exit()
194 zassert_equal(o->transition_bits, test_value[o->tv_idx], in p03_entry()
206 zassert_equal(o->transition_bits, test_value[o->tv_idx], in p03_run()
218 zassert_equal(o->transition_bits, test_value[o->tv_idx], in p03_exit()
[all …]
Dtest_lib_hierarchical_smf.c70 static uint32_t test_value[] = { variable
123 zassert_equal(o->transition_bits, test_value[o->tv_idx], in parent_ab_entry()
140 zassert_equal(o->transition_bits, test_value[o->tv_idx], in parent_ab_run()
159 zassert_equal(o->transition_bits, test_value[o->tv_idx], in parent_ab_exit()
176 zassert_equal(o->transition_bits, test_value[o->tv_idx], in parent_c_entry()
193 zassert_equal(o->transition_bits, test_value[o->tv_idx], in parent_c_exit()
204 zassert_equal(o->transition_bits, test_value[o->tv_idx], in state_a_entry()
221 zassert_equal(o->transition_bits, test_value[o->tv_idx], in state_a_run()
235 zassert_equal(o->transition_bits, test_value[o->tv_idx], in state_a_exit()
246 zassert_equal(o->transition_bits, test_value[o->tv_idx], in state_b_entry()
[all …]
Dtest_lib_flat_smf.c43 static uint32_t test_value[] = { variable
86 zassert_equal(o->transition_bits, test_value[o->tv_idx], in state_a_entry()
102 zassert_equal(o->transition_bits, test_value[o->tv_idx], in state_a_run()
115 zassert_equal(o->transition_bits, test_value[o->tv_idx], in state_a_exit()
126 zassert_equal(o->transition_bits, test_value[o->tv_idx], in state_b_entry()
137 zassert_equal(o->transition_bits, test_value[o->tv_idx], in state_b_run()
155 zassert_equal(o->transition_bits, test_value[o->tv_idx], in state_b_exit()
165 zassert_equal(o->transition_bits, test_value[o->tv_idx], in state_c_entry()
175 zassert_equal(o->transition_bits, test_value[o->tv_idx], in state_c_run()
187 zassert_equal(o->transition_bits, test_value[o->tv_idx], in state_c_exit()
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Dtest_lib_self_transition_smf.c81 static uint32_t test_value[] = { variable
163 zassert_equal(o->transition_bits, test_value[o->tv_idx], "Test Root entry failed"); in root_entry()
174 zassert_equal(o->transition_bits, test_value[o->tv_idx], "Test Root run failed"); in root_run()
187 zassert_equal(o->transition_bits, test_value[o->tv_idx], "Test Root exit failed"); in root_exit()
197 zassert_equal(o->transition_bits, test_value[o->tv_idx], "Test Parent AB entry failed"); in parent_ab_entry()
213 zassert_equal(o->transition_bits, test_value[o->tv_idx], "Test Parent AB run failed"); in parent_ab_run()
237 zassert_equal(o->transition_bits, test_value[o->tv_idx], "Test Parent AB exit failed"); in parent_ab_exit()
253 zassert_equal(o->transition_bits, test_value[o->tv_idx], "Test Parent C entry failed"); in parent_c_entry()
268 zassert_equal(o->transition_bits, test_value[o->tv_idx], "Test Parent C run failed"); in parent_c_run()
281 zassert_equal(o->transition_bits, test_value[o->tv_idx], "Test Parent C exit failed"); in parent_c_exit()
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/Zephyr-latest/tests/kernel/common/src/
Dpow2.c56 static void test_pow2_ceil_x(unsigned long test_value, in test_pow2_ceil_x() argument
59 volatile unsigned int x = test_value; in test_pow2_ceil_x()
64 test_value, result, expected_result); in test_pow2_ceil_x()
/Zephyr-latest/tests/subsys/edac/ibecc/src/
Dibecc.c98 uint32_t test_value; in ZTEST() local
111 ret = edac_inject_get_error_type(dev, &test_value); in ZTEST()
113 zassert_equal(test_value, 0, "Error type not zero"); in ZTEST()
171 uint32_t test_value; in test_inject() local
196 ret = edac_inject_get_error_type(dev, &test_value); in test_inject()
198 zassert_equal(test_value, type, "Read back value differs"); in test_inject()
206 test_value = sys_read32(test_addr); in test_inject()
207 LOG_DBG("Read value 0x%llx: 0x%x", test_addr, test_value); in test_inject()
214 test_value = sys_read32(test_addr); in test_inject()
215 LOG_DBG("Read value 0x%llx: 0x%x", test_addr, test_value); in test_inject()
/Zephyr-latest/tests/bluetooth/gatt/src/
Dmain.c25 static uint8_t test_value[] = { 'T', 'e', 's', 't', '\0' }; variable
57 if (offset + len > sizeof(test_value)) { in write_test()
74 read_test, write_test, test_value),
157 read_test, write_test, test_value), in ZTEST()
222 read_test, write_test, test_value), in ZTEST()
285 read_test, write_test, test_value), in ZTEST()
385 test_value, 0, find_attr, &attr); in ZTEST()
388 zassert_equal(attr->user_data, test_value, in ZTEST()
434 zassert_equal(ret, strlen(test_value), in ZTEST()
436 zassert_mem_equal(buf, test_value, ret, in ZTEST()
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/Zephyr-latest/tests/drivers/sensor/adltc2990/src/
Dmain.c233 float test_value = voltage_values[0].val1 + (float)voltage_values[0].val2 / 1000000; in ZTEST_F() local
235 zassert_between_inclusive(test_value, -0.16f, -0.159f, "Out of Range [-0.16,-0.159]%.6f", in ZTEST_F()
236 (double)test_value); in ZTEST_F()
238 test_value = voltage_values[1].val1 + (float)voltage_values[1].val2 / 1000000; in ZTEST_F()
239 zassert_between_inclusive(test_value, 2.69f, 2.7f, "Out of Range [2.69, 2.7]%.6f", in ZTEST_F()
240 (double)test_value); in ZTEST_F()
471 double test_value = voltage_values[4].val1 + (double)voltage_values[4].val2 / 1000000; in ZTEST_F() local
473 zassert_between_inclusive(test_value, 6.0, 6.1, "Out of Range [6.0,6.1] %.6f", in ZTEST_F()
474 (double)test_value); in ZTEST_F()
/Zephyr-latest/tests/bsim/bluetooth/host/gatt/settings/src/
Dgatt_utils.c31 static uint8_t test_value[] = { 'T', 'e', 's', 't', '\0' }; variable
60 if (offset + len > sizeof(test_value)) { in write_test()
77 read_test, write_test, test_value),
88 read_test, write_test, test_value),
/Zephyr-latest/tests/subsys/settings/fcb/src/
Dsettings_test.h52 char test_value[SETTINGS_TEST_FCB_VAL_STR_CNT][SETTINGS_MAX_VAL_LEN],
Dsettings_test_fcb.c202 test_config_fill_area(char test_value[SETTINGS_TEST_FCB_VAL_STR_CNT] in test_config_fill_area()
210 test_value[j][i] = ((j * 2) + i + iteration) % 10 + '0'; in test_config_fill_area()
212 test_value[j][sizeof(test_value[j]) - 1] = '\0'; in test_config_fill_area()
/Zephyr-latest/tests/drivers/fuel_gauge/sbs_gauge/src/
Dtest_sbs_gauge.c242 uint16_t test_value = 0x1001; in ZTEST_USER_F() local
245 .sbs_mfr_access_word = test_value, in ZTEST_USER_F()
251 zassert_equal(mfr_acc_get.sbs_mfr_access_word, test_value); in ZTEST_USER_F()