Searched refs:test_pattern (Results 1 – 2 of 2) sorted by relevance
/Zephyr-latest/tests/drivers/uart/uart_elementary/src/ |
D | main.c | 37 const uint8_t test_pattern[TEST_BUFFER_LEN] = { 0x11, 0x12, 0x13, 0x14, 0x15, variable 55 uint8_t *tx_data_pointer = (uint8_t *)(test_pattern + *tx_byte_offset); in uart_tx_interrupt_service() 226 zassert_equal(test_buffer[index], test_pattern[index], in ZTEST() 228 test_buffer[index], test_pattern[index]); in ZTEST() 321 zassert_equal(test_buffer[index], test_pattern[index], in ZTEST() 323 index, test_buffer[index], test_pattern[index]); in ZTEST() 324 zassert_equal(test_buffer_aux[index], test_pattern[index], in ZTEST() 326 index, test_buffer_aux[index], test_pattern[index]); in ZTEST()
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/Zephyr-latest/drivers/mipi_dsi/ |
D | dsi_stm32.c | 46 int test_pattern; member 302 if (config->test_pattern >= 0) { in mipi_dsi_stm32_attach() 303 ret = HAL_DSI_PatternGeneratorStart(&data->hdsi, 0, config->test_pattern); in mipi_dsi_stm32_attach() 472 .test_pattern = DT_INST_PROP_OR(inst, test_pattern, -1), \
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