Searched refs:test_irq (Results 1 – 5 of 5) sorted by relevance
38 unsigned int test_irq = irq_to_level_2(local_irq) | parent_irq[i]; in ZTEST() local39 unsigned int test_isr_offset = z_get_sw_isr_table_idx(test_irq); in ZTEST()73 unsigned int test_irq; in ZTEST() local79 test_irq = irq_to_level_2(local_irq) | parent_irq[i]; in ZTEST()80 test_dev = z_get_sw_isr_device_from_irq(test_irq); in ZTEST()85 test_irq = z_get_sw_isr_irq_from_device(parent_dev[i]); in ZTEST()86 zassert_equal(parent_irq[i], test_irq, "%d: expected offset: %d, got: %d", i, in ZTEST()87 parent_irq[i], test_irq); in ZTEST()
192 int test_irq(int offset) in test_irq() function235 if (test_irq(offset)) { in check_vector()270 if (test_irq(offset)) { in check_sw_isr()
168 ZTEST_F(uart_emul_device, test_irq) in ZTEST_F() argument
457 test_irq: interrupt-holder {
23 #define TEST_IRQ DT_NODELABEL(test_irq)734 ZTEST(devicetree_api, test_irq) in ZTEST() argument2770 zassert_true(DT_DEP_ORD(DT_NODELABEL(test_irq)) > in ZTEST()
