Searched refs:test0 (Results 1 – 3 of 3) sorted by relevance
/Zephyr-latest/tests/unit/crc/ |
D | main.c | 105 uint8_t test0[] = { }; in ZTEST() local 111 zassert_equal(crc16_ccitt(0, test0, sizeof(test0)), 0x0); in ZTEST() 140 uint8_t test0[] = { in ZTEST() local 148 zassert_equal(crc16_ccitt(0xffff, test0, sizeof(test0)), in ZTEST() 178 uint8_t test0[] = { 0 }; in ZTEST() local 182 zassert_equal(crc8_ccitt(CRC8_CCITT_INITIAL_VALUE, test0, sizeof(test0)), 0xF3); in ZTEST() 189 uint8_t test0[] = { 0 }; in ZTEST() local 196 zassert_equal(crc8_rohc(CRC8_ROHC_INITIAL_VALUE, test0, sizeof(test0)), 0xcf); in ZTEST() 206 uint8_t test0[] = { 0 }; in ZTEST() local 210 zassert_equal(crc7_be(0, test0, sizeof(test0)), 0); in ZTEST() [all …]
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/Zephyr-latest/dts/riscv/sifive/ |
D | riscv32-fe310.dtsi | 232 compatible = "sifive,test0";
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/Zephyr-latest/tests/unit/util/ |
D | main.c | 287 uint8_t test0[] = { 0, FOR_EACH(FOR_EACH_MACRO_TEST2, (,))}; in ZTEST() local 289 BUILD_ASSERT(sizeof(test0) == 1, "Unexpected length due to FOR_EACH fail"); in ZTEST()
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