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/Zephyr-4.3.0/include/zephyr/sys/
D__assert.h54 #define __ASSERT_LOC(test) \ argument
56 Z_STRINGIFY(test), \
61 #define __ASSERT_LOC(test) \ argument
67 #define __ASSERT_LOC(test) \ argument
69 Z_STRINGIFY(test))
73 #define __ASSERT_LOC(test) \ argument
111 #define __ASSERT_NO_MSG(test) \ argument
113 if (!(test)) { \
114 __ASSERT_LOC(test); \
120 #define __ASSERT(test, fmt, ...) \ argument
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/Zephyr-4.3.0/include/zephyr/net/
Dnet_pkt_filter.h40 typedef bool (npf_test_fn_t)(struct npf_test *test, struct net_pkt *pkt);
255 #define Z_NPF_TEST_ADDR(arg) &arg.test
270 struct npf_test test; member
290 .test.fn = npf_iface_match, \
292 (.test.name = "iface", \
293 .test.type = NPF_TEST_TYPE_IFACE_MATCH,)) \
305 .test.fn = npf_iface_unmatch, \
307 (.test.name = "!iface", \
308 .test.type = NPF_TEST_TYPE_IFACE_UNMATCH,)) \
320 .test.fn = npf_orig_iface_match, \
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/Zephyr-4.3.0/subsys/net/pkt_filter/
Dethernet.c26 static bool addr_match(struct npf_test *test, struct net_eth_addr *pkt_addr) in addr_match() argument
29 CONTAINER_OF(test, struct npf_test_eth_addr, test); in addr_match()
44 bool npf_eth_src_addr_match(struct npf_test *test, struct net_pkt *pkt) in npf_eth_src_addr_match() argument
48 return addr_match(test, &eth_hdr->src); in npf_eth_src_addr_match()
51 bool npf_eth_src_addr_unmatch(struct npf_test *test, struct net_pkt *pkt) in npf_eth_src_addr_unmatch() argument
53 return !npf_eth_src_addr_match(test, pkt); in npf_eth_src_addr_unmatch()
56 bool npf_eth_dst_addr_match(struct npf_test *test, struct net_pkt *pkt) in npf_eth_dst_addr_match() argument
60 return addr_match(test, &eth_hdr->dst); in npf_eth_dst_addr_match()
63 bool npf_eth_dst_addr_unmatch(struct npf_test *test, struct net_pkt *pkt) in npf_eth_dst_addr_unmatch() argument
65 return !npf_eth_dst_addr_match(test, pkt); in npf_eth_dst_addr_unmatch()
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Dbase.c83 struct npf_test *test; in apply_tests() local
88 test = rule->tests[i]; in apply_tests()
89 result = test->fn(test, pkt); in apply_tests()
91 COND_CODE_1(NPF_TEST_ENABLE_NAME, (test->name), ("")), in apply_tests()
92 test, result); in apply_tests()
244 bool npf_iface_match(struct npf_test *test, struct net_pkt *pkt) in npf_iface_match() argument
247 CONTAINER_OF(test, struct npf_test_iface, test); in npf_iface_match()
256 bool npf_iface_unmatch(struct npf_test *test, struct net_pkt *pkt) in npf_iface_unmatch() argument
258 return !npf_iface_match(test, pkt); in npf_iface_unmatch()
261 bool npf_orig_iface_match(struct npf_test *test, struct net_pkt *pkt) in npf_orig_iface_match() argument
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/Zephyr-4.3.0/tests/bsim/bluetooth/mesh/src/
Dmain.c14 extern struct bst_test_list *test_dfu_install(struct bst_test_list *test);
15 extern struct bst_test_list *test_blob_pst_install(struct bst_test_list *test);
16 extern struct bst_test_list *test_lcd_install(struct bst_test_list *test);
17 extern struct bst_test_list *test_sar_pst_install(struct bst_test_list *test);
18 extern struct bst_test_list *test_brg_install(struct bst_test_list *test);
20 extern struct bst_test_list *test_proxy_sol_install(struct bst_test_list *test);
23 extern struct bst_test_list *test_adv_install(struct bst_test_list *test);
24 extern struct bst_test_list *test_suspend_install(struct bst_test_list *test);
30 extern struct bst_test_list *test_suspend_install(struct bst_test_list *test);
31 extern struct bst_test_list *test_adv_install(struct bst_test_list *test);
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/Zephyr-4.3.0/tests/drivers/disk/disk_performance/
DREADME.txt4 This test is intended to test the performance of disk devices under Zephyr. It
6 The test has the following phases:
8 * Setup test: simply sets up the disk, and reads data such as the sector count
11 * Sequential read test: This test performs sequential reads, first only over one
14 * Random read test: This test performs random reads across the disk, each one
17 * Sequential write test: This test performs sequential writes, first only over
20 * Random write test: This test performs random writes across the disk, each one
/Zephyr-4.3.0/subsys/testsuite/ztest/src/
Dztest.c85 static int cleanup_test(struct ztest_unit_test *test) in cleanup_test() argument
103 PRINT_DATA("Test %s failed: Unused mock parameter values\n", test->name); in cleanup_test()
106 PRINT_DATA("Test %s failed: Unused mock return values\n", test->name); in cleanup_test()
312 __maybe_unused static void run_test_rules(bool is_before, struct ztest_unit_test *test, void *data) in run_test_rules() argument
317 rule->before_each(test, data); in run_test_rules()
319 rule->after_each(test, data); in run_test_rules()
324 static void run_test_functions(struct ztest_suite_node *suite, struct ztest_unit_test *test, in run_test_functions() argument
328 test->test(data); in run_test_functions()
333 static int get_final_test_result(const struct ztest_unit_test *test, int ret) in get_final_test_result() argument
340 if (strcmp(expectation->test_name, test->name) == 0 && in get_final_test_result()
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Dztest_rules.c10 static void one_cpu_rule_before_each(const struct ztest_unit_test *test, void *data) in one_cpu_rule_before_each() argument
12 ARG_UNUSED(test); in one_cpu_rule_before_each()
16 static void one_cpu_rule_after_each(const struct ztest_unit_test *test, void *data) in one_cpu_rule_after_each() argument
18 ARG_UNUSED(test); in one_cpu_rule_after_each()
/Zephyr-4.3.0/tests/bsim/bluetooth/mesh/
DREADME.rst5 subsystem. The tests run on the BabbleSim simulator, using the BabbleSim test
11 src/ directory containing the necessary test harnesses to execute the tests.
13 There's only a single test application for all the Bluetooth Mesh BabbleSim
14 tests. The test application is built from this directory, and includes all test
15 harnesses in every build. The overlying bsim test framework selects the harness
16 to use at runtime, using the test identifiers passed in the test scripts.
30 Individual test harnesses can be run outside of ``RunTest()`` by setting the
36 When running test applications independently, make sure to assign the original
39 Example: To debug the ``transport_tx_seg_block`` test harness in the transport
40 seg_block test, change transport/seg_block.sh to
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/Zephyr-4.3.0/tests/kernel/workq/work_queue/
DREADME.txt33 Starting sequence test
34 - Initializing test items
35 - Submitting test items
37 - Running test item 1
41 - Running test item 2
45 - Running test item 3
46 - Running test item 4
47 - Running test item 5
48 - Running test item 6
50 Starting resubmit test
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/Zephyr-4.3.0/tests/drivers/i2s/i2s_additional/
DKconfig30 When set to 'y', test will check that i2s_configure() returns -EINVAL.
31 When set to 'n', test will do the transmission.
36 When set to 'y', test will check that i2s_configure() returns -EINVAL.
37 When set to 'n', test will do the transmission.
42 When set to 'y', test will check that i2s_configure() returns -EINVAL.
43 When set to 'n', test will do the transmission.
48 When set to 'y', test will check that i2s_configure() returns -EINVAL.
49 When set to 'n', test will do the transmission.
55 When set to 'y', test will check that i2s_configure() returns -EINVAL.
56 When set to 'n', test will do the transmission.
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/Zephyr-4.3.0/subsys/tracing/ctf/
Dctf_map.h57 #define MAP_NEXT0(test, next, ...) next MAP_OUT argument
58 #define MAP_NEXT1(test, next) MAP_NEXT0(test, next, 0) argument
59 #define MAP_NEXT(test, next) MAP_NEXT1(MAP_GET_END test, next) argument
64 #define MAP_LIST_NEXT1(test, next) MAP_NEXT0(test, MAP_COMMA next, 0) argument
65 #define MAP_LIST_NEXT(test, next) MAP_LIST_NEXT1(MAP_GET_END test, next) argument
/Zephyr-4.3.0/tests/kernel/sleep/
DREADME.txt5 This test verifies that cooperative sleep and wakeup APIs operate as
34 Running test suite sleep
36 starting test - test_sleep
41 Testing: test thread sleep + helper thread wakeup test
42 Testing: test thread sleep + isr offload wakeup test
43 Testing: test thread sleep + main wakeup test thread
47 starting test - test_usleep
/Zephyr-4.3.0/tests/cmake/overlays/soc_folder_overlay/
DKconfig6 default "$(dt_alias_enabled,test-app)"
10 default "$(dt_alias_enabled,test-board)"
14 default "$(dt_alias_enabled,test-board-suffix)"
18 default "$(dt_alias_enabled,test-board-qualifiers)"
22 default "$(dt_alias_enabled,test-soc)"
26 default "$(dt_alias_enabled,test-soc-suffix)"
/Zephyr-4.3.0/tests/drivers/disk/disk_access/
DREADME.txt4 This test is intended to verify the functionality of disk devices in Zephyr.
5 It is designed to test the NXP USDHC disk driver, but can be used for other
6 disk devices as well. The test has the following phases:
8 * Setup test: Verifies that disk initialization works, as well as testing
10 Note that this test also verifies the memory buffers reserved for read/write
14 * Read test: Verifies that the driver can consistently read sectors. This test
17 The test deliberately will read sectors beyond the end of the disk, and if
22 * Write test: Verifies that the driver can consistently write sectors. This test
23 follows the same flow as the read test, but at each step writes data to the
24 disk and reads it back to verify correctness. The test first performs writes
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/Zephyr-4.3.0/tests/lib/mem_alloc/
DREADME.txt6 This test verifies kernel access to the dynamic memory allocation functions
10 or non-functional, and is NOT intended to be a comprehensive test suite
40 Running test suite test_c_lib_dynamic_memalloc
42 starting test - test_malloc
45 starting test - test_free
48 starting test - test_calloc
51 starting test - test_realloc
54 starting test - test_reallocarray
57 starting test - test_memalloc_all
60 starting test - test_memalloc_max
/Zephyr-4.3.0/samples/subsys/usb/testusb/
DREADME.rst8 to test USB device drivers and the device stack connected to a Linux host
61 /dev/bus/usb/009/016 test 0, 0.000007 secs
62 /dev/bus/usb/009/016 test 9, 4.994475 secs
63 /dev/bus/usb/009/016 test 10, 11.990054 secs
110 /dev/bus/usb/009/017 test 0, 0.000008 secs
111 /dev/bus/usb/009/017 test 1, 2.000001 secs
112 /dev/bus/usb/009/017 test 2, 2.003058 secs
113 /dev/bus/usb/009/017 test 3, 1.054082 secs
114 /dev/bus/usb/009/017 test 4, 1.001010 secs
115 /dev/bus/usb/009/017 test 5, 57.962142 secs
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/Zephyr-4.3.0/tests/benchmarks/data_structure_perf/rbtree_perf/src/
Drbtree_perf.c134 static void verify_rbtree_perf(struct rbnode *root, struct rbnode *test) in verify_rbtree_perf() argument
138 node_height = search_height_recurse(root, test, node_height); in verify_rbtree_perf()
193 struct rbnode *test = NULL; in ZTEST() local
195 test = rb_get_min(&test_rbtree); in ZTEST()
196 verify_rbtree_perf(root, test); in ZTEST()
198 test = rb_get_max(&test_rbtree); in ZTEST()
199 verify_rbtree_perf(root, test); in ZTEST()
206 test = &nodes[TREE_SIZE/2]; in ZTEST()
207 verify_rbtree_perf(root, test); in ZTEST()
/Zephyr-4.3.0/tests/drivers/uart/uart_elementary/
DKconfig1 # UART test configuration options
6 bool "Enable dual UART test"
9 bool "Enable mismatched configuration in dual UART test"
12 int "UART baudrate for DUT_AUX to test mismatch case"
17 to test error detection.
/Zephyr-4.3.0/tests/ztest/fail/
DKconfig5 prompt "Select the type of failure to test"
26 bool "Add a test which fails a zassume() call"
32 default "ERROR: cannot fail in test phase 'after()', bailing" if ZTEST_FAIL_TEST_ASSERT_AFTER
33 default "ERROR: cannot fail in test phase 'teardown()', bailing" if ZTEST_FAIL_TEST_ASSERT_TEARDOWN
34 …default "ERROR: cannot skip in test phase 'after()', bailing" if ZTEST_FAIL_TEST_ASSUME_AFTER && !…
35 …default "ERROR: cannot skip in test phase 'teardown()', bailing" if ZTEST_FAIL_TEST_ASSUME_TEARDOW…
36 …default "ERROR: cannot fail in test phase 'after()', bailing" if ZTEST_FAIL_TEST_ASSUME_AFTER && Z…
37 …default "ERROR: cannot fail in test phase 'teardown()', bailing" if ZTEST_FAIL_TEST_ASSUME_TEARDOW…
38 default "ERROR: cannot pass in test phase 'after()', bailing" if ZTEST_FAIL_TEST_PASS_AFTER
39 default "ERROR: cannot pass in test phase 'teardown()', bailing" if ZTEST_FAIL_TEST_PASS_TEARDOWN
DREADME.rst9 In order to test the actual framework's failure cases, this test suite has to do something unique.
10 There's a subdirectory to this test called 'core'. This project builds a sample as a
13 - ``ztest_test_fail()`` during either the ``after`` or ``teardown`` phase of the test suite
14 - ``ztest_test_skip()`` during either the ``after`` or ``teardown`` phase of the test suite
15 - ``ztest_test_pass()`` during either the ``after`` or ``teardown`` phase of the test suite
19 The binary by itself, when executed, will fail to run and return a code of ``1``. The main test
20 binary will use ``popen()`` to run the failing test binary and will assert both the return code and
/Zephyr-4.3.0/tests/subsys/sd/sdio/
DREADME.txt4 This test is designed to verify the SD subsystem stack implementation for SDIO
5 devices. Note that this test will only perform basic reads from the SDIO card
8 The test has the following phases:
10 * Init test: verify the SD host controller can detect card presence, and
11 test the initialization flow of the SDIO subsystem to verify that the stack
14 * Read test: verify that a read from the SDIO common card register area returns
17 * Configuration test: verify that the SD stack reports a valid configuration
/Zephyr-4.3.0/tests/benchmarks/sys_kernel/
DREADME.txt5 The SysKernel test measures the performance of semaphore,
12 MODULE: kernel API test
15 Each test below is repeated 10 times;
23 Starting test. Please wait...
34 Starting test. Please wait...
46 Starting test. Please wait...
56 Starting test. Please wait...
68 Starting test. Please wait...
80 Starting test. Please wait...
90 Starting test. Please wait...
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/Zephyr-4.3.0/tests/subsys/sd/mmc/
DREADME.txt4 This test is designed to verify the MMC protocol stack implementation,
7 this test also serves as a complete test for the SDHC driver implementation in
9 perform destructive I/O on the card, wiping any data present. The test has
12 * Init test: verify the SD host controller can detect card presence, and
13 test the initialization flow of the MMC subsystem to verify that the stack
16 * IOCTL test: verify the SD subsystem correctly implements IOCTL calls required
19 * Read test: verify that single block reads work, followed by multiple
23 * Write test: verify that single block writes work, followed by multiple
27 * R/W test: write data to the MMC card, and verify that it is able
/Zephyr-4.3.0/tests/subsys/sd/sdmmc/
DREADME.txt4 This test is designed to verify the SD subsystem stack implementation,
7 this test also serves as a complete test for the SDHC driver implementation in
9 perform destructive I/O on the card, wiping any data present. The test has
12 * Init test: verify the SD host controller can detect card presence, and
13 test the initialization flow of the SDMMC subsystem to verify that the stack
16 * IOCTL test: verify the SD subsystem correctly implements IOCTL calls required
19 * Read test: verify that single block reads work, followed by multiple
23 * Write test: verify that single block writes work, followed by multiple
27 * R/W test: write data to the SD card, and verify that it is able

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