/* common.h - Common test code */ /* * Copyright (c) 2022 Nordic Semiconductor * * SPDX-License-Identifier: Apache-2.0 */ #include #include #include #include #include #include #include #include #include "bs_types.h" #include "bs_tracing.h" #include "bstests.h" #include "bs_pc_backchannel.h" extern enum bst_result_t bst_result; #define CREATE_FLAG(flag) static atomic_t flag = (atomic_t)false #define SET_FLAG(flag) (void)atomic_set(&flag, (atomic_t)true) #define WAIT_FOR_FLAG(flag) \ while (!(bool)atomic_get(&flag)) { \ (void)k_sleep(K_MSEC(1)); \ } #define FAIL(...) \ do { \ bst_result = Failed; \ bs_trace_error_time_line(__VA_ARGS__); \ } while (0) #define PASS(...) \ do { \ bst_result = Passed; \ bs_trace_info_time(1, __VA_ARGS__); \ } while (0) extern volatile int num_eatt_channels; extern struct bt_conn *default_conn; void central_setup_and_connect(void); void peripheral_setup_and_connect(void); void wait_for_disconnect(void); void disconnect(void); void test_init(void); void test_tick(bs_time_t HW_device_time); void backchannel_init(void); void backchannel_sync_send(void); void backchannel_sync_wait(void);