/* Copyright (c) 2023 Nordic Semiconductor ASA * SPDX-License-Identifier: Apache-2.0 */ #include "bstests.h" #include LOG_MODULE_REGISTER(bt_bsim_ead_sample_data, CONFIG_BT_EAD_LOG_LEVEL); extern void test_central(void); extern void test_peripheral(void); extern void test_args_parse(int argc, char *argv[]); static const struct bst_test_instance test_def[] = { { .test_id = "central", .test_descr = "Central device", .test_main_f = test_central, .test_args_f = test_args_parse, }, { .test_id = "peripheral", .test_descr = "Peripheral device", .test_main_f = test_peripheral, .test_args_f = test_args_parse, }, BSTEST_END_MARKER}; struct bst_test_list *test_encrypted_ad_data_install(struct bst_test_list *tests) { return bst_add_tests(tests, test_def); } bst_test_install_t test_installers[] = {test_encrypted_ad_data_install, NULL}; int main(void) { bst_main(); return 0; }