44 TEST(i, sscanf(# x, "%lf", &d), 1, "got %d fields, expected %d"), \
45 TEST(t, d, (double)x, "%a != %a") )
48 TEST(i, sscanf(v, "%lf", &d), 1, "got %d fields, expected %d"), \
49 TEST(t, d, (double)x, "%a != %a") )
80 	double d, t;  in test_sscanf()  local
219     TEST(i, sscanf(" Nan(98b)", "%lf%c", &d, a), 1, "got %d fields, expected %d");  in test_sscanf()
220     TEST(i, isnan(d), 1, "isnan %d expected %d");  in test_sscanf()
226     d = 1.0;  in test_sscanf()
227     TEST(i, sscanf("NaN(abcdefg", "%lf%c", &d, a), -1, "got %d fields, expected %d");  in test_sscanf()
228     TEST(i, d, 1.0, "%d expected %lf");  in test_sscanf()
234     d = 1.0;  in test_sscanf()
235     TEST(i, sscanf("NaN(12:b)", "%lf%c", &d, a), 0, "got %d fields, expected %d");  in test_sscanf()
236     TEST(i, d, 1.0, "%d expected %lf");  in test_sscanf()
242     d = 1.0;  in test_sscanf()
243     TEST(i, sscanf("Nan(12345)", "%9lf%c", &d, a), 0, "got %d fields, expected %d");  in test_sscanf()
244     TEST(i, d, 1.0, "%d expected %lf");  in test_sscanf()
250     d = 1.0;  in test_sscanf()
251     TEST(i, sscanf("inf(12b)", "%lf%c", &d, a), 2, "got %d fields, expected %d");  in test_sscanf()
252     TEST(i, isinf(d), 1, "%d expected %d");  in test_sscanf()
258     d = 1.0;  in test_sscanf()
259     TEST(i, sscanf("infinity(abcd)", "%lf%c", &d, a), 2, "got %d fields, expected %d");  in test_sscanf()
260     TEST(i, isinf(d), 1, "%d expected %d");  in test_sscanf()
305         (void) d;  in test_sscanf()
322         TEST(i, sscanf("nan", "%lg", &d), 1, "got %d fields, expected %d");  in test_sscanf()
323         TEST(i, isnan(d), 1, "isnan %d expected %d");  in test_sscanf()
324         TEST(i, !!signbit(d), 0, "signbit %d expected %d");  in test_sscanf()
325         TEST(i, sscanf("-nan", "%lg", &d), 1, "got %d fields, expected %d");  in test_sscanf()
326         TEST(i, isnan(d), 1, "isnan %d expected %d");  in test_sscanf()
327         TEST(i, !!signbit(d), 1, "signbit %d expected %d");  in test_sscanf()
331         d = 1.0;  in test_sscanf()
332         TEST(i, sscanf("-inf", "%3lg", &d), 0, "got %d fields, expected %d");  in test_sscanf()
333         TEST(i, d, 1.0, "%g expected %g");  in test_sscanf()
335         TEST(i, sscanf("-inf", "%4lg", &d), 1, "got %d fields, expected %d");  in test_sscanf()
336         TEST(i, isinf(d), 1, "isinf %d expected %d");  in test_sscanf()
337         TEST(i, !!signbit(d), 1, "signbit %d expected %d");  in test_sscanf()
341 	TEST(i, sscanf("10e", "%lf", &d), 0, "got %d fields, expected no match (%d)");  in test_sscanf()
343 	TEST(i, sscanf("", "%lf\n", &d), -1, "got %d fields, expected input failure (%d)");  in test_sscanf()