Lines Matching refs:test
202 bool "GPIO triggers boot from test app partition"
206 Allows to run the test app from "TEST" partition.
207 …A boot from "test" partition will occur if there is a GPIO input pulled low while device starts up.
217 To trigger a test app, this GPIO must be pulled low on reset.
223 bool "App test GPIO level"
227 Pin level for app test, can be triggered on low or high.
230 bool "Enter test app on GPIO low"
233 bool "Enter test app on GPIO high"
237 int "Hold time of GPIO for reset/test mode (seconds)"
242 before a factory reset or test partition boot (as applicable) is performed.
285 … Pay attention to options such as reset to factory, trigger test partition and encryption on boot
342 bool "Emulate operations with efuse secure version(only test)"
349 It allows to test anti-rollback implemention without permanent write eFuse bits.