51         Testing::param_t *data;
52         Testing::nbSamples_t nbInputSamples;
53         Testing::nbSamples_t nbOutputSamples;
144     std::string FPGA::getOutputPath(Testing::outputID_t id)  in getOutputPath()
163     Testing::nbParameters_t FPGA::ReadNbParameters()  in ReadNbParameters()
178         Testing::PatternID_t paramID;  in ReadTestIdentification()
257     void FPGA::DispStatus(Testing::TestStatus status  in DispStatus()
258       ,Testing::errorID_t error  in DispStatus()
260       ,Testing::cycles_t cycles)  in DispStatus()
262         if (status == Testing::kTestFailed)  in DispStatus()
322     void FPGA::ReadParameterList(Testing::nbParameters_t nbParams)  in ReadParameterList()
354               Testing::param_t *p,*current;  in ReadParameterList()
363               p=(Testing::param_t*)malloc(sizeof(Testing::param_t)*(nbInputSamples));  in ReadParameterList()
369                 *current++ = (Testing::param_t)sample;  in ReadParameterList()
402     unsigned long FPGA::getPatternOffset(Testing::PatternID_t id)  in getPatternOffset()
407     Testing::nbSamples_t FPGA::GetPatternSize(Testing::PatternID_t id)  in GetPatternSize()
409       return((Testing::nbSamples_t)((*this->patternSizes)[id]));  in GetPatternSize()
412     unsigned long FPGA::getParameterOffset(Testing::PatternID_t id)  in getParameterOffset()
417     struct offsetOrGen FPGA::getParameterDesc(Testing::PatternID_t id)  in getParameterDesc()
425     void FPGA::DumpParams(std::vector<Testing::param_t>& params)  in DumpParams()
429 …        for(std::vector<Testing::param_t>::iterator it = params.begin(); it != params.end(); ++it)   in DumpParams()
441 …Testing::param_t* FPGA::ImportParams(Testing::PatternID_t id,Testing::nbParameterEntries_t &nbEntr…  in ImportParams()
447         Testing::nbSamples_t len;  in ImportParams()
453            paramKind=Testing::kStaticBuffer;  in ImportParams()
459            return((Testing::param_t*)patternStart);  in ImportParams()
463           Testing::param_t* result;  in ImportParams()
466           paramKind=Testing::kDynamicBuffer;  in ImportParams()
468           result=(Testing::param_t*)malloc(len*sizeof(Testing::param_t));  in ImportParams()
498     Testing::PatternID_t FPGA::getParamID()  in getParamID()
505     void FPGA::ImportPattern_f64(Testing::PatternID_t id,char* p,Testing::nbSamples_t nb)  in ImportPattern_f64()
524     void FPGA::ImportPattern_f32(Testing::PatternID_t id,char* p,Testing::nbSamples_t nb)  in ImportPattern_f32()
545     void FPGA::ImportPattern_f16(Testing::PatternID_t id,char* p,Testing::nbSamples_t nb)  in ImportPattern_f16()
566     void FPGA::ImportPattern_q63(Testing::PatternID_t id,char* p,Testing::nbSamples_t nb)  in ImportPattern_q63()
585     void FPGA::ImportPattern_q31(Testing::PatternID_t id,char* p,Testing::nbSamples_t nb)  in ImportPattern_q31()
604     void FPGA::ImportPattern_q15(Testing::PatternID_t id,char* p,Testing::nbSamples_t nb)  in ImportPattern_q15()
623     void FPGA::ImportPattern_q7(Testing::PatternID_t id,char* p,Testing::nbSamples_t nb)  in ImportPattern_q7()
642     void FPGA::ImportPattern_u64(Testing::PatternID_t id,char* p,Testing::nbSamples_t nb)  in ImportPattern_u64()
662     void FPGA::ImportPattern_u32(Testing::PatternID_t id,char* p,Testing::nbSamples_t nb)  in ImportPattern_u32()
681     void FPGA::ImportPattern_u16(Testing::PatternID_t id,char* p,Testing::nbSamples_t nb)  in ImportPattern_u16()
700     void FPGA::ImportPattern_u8(Testing::PatternID_t id,char* p,Testing::nbSamples_t nb)  in ImportPattern_u8()
727     void FPGA::DumpPattern_f64(Testing::outputID_t id,Testing::nbSamples_t nb, float64_t* data)  in DumpPattern_f64()
733            Testing::nbSamples_t i=0;  in DumpPattern_f64()
750     void FPGA::DumpPattern_f32(Testing::outputID_t id,Testing::nbSamples_t nb, float32_t* data)  in DumpPattern_f32()
756             Testing::nbSamples_t i=0;  in DumpPattern_f32()
770     void FPGA::DumpPattern_f16(Testing::outputID_t id,Testing::nbSamples_t nb, float16_t* data)  in DumpPattern_f16()
776             Testing::nbSamples_t i=0;  in DumpPattern_f16()
790     void FPGA::DumpPattern_q63(Testing::outputID_t id,Testing::nbSamples_t nb, q63_t* data)  in DumpPattern_q63()
796            Testing::nbSamples_t i=0;  in DumpPattern_q63()
813     void FPGA::DumpPattern_q31(Testing::outputID_t id,Testing::nbSamples_t nb, q31_t* data)  in DumpPattern_q31()
819            Testing::nbSamples_t i=0;  in DumpPattern_q31()
832     void FPGA::DumpPattern_q15(Testing::outputID_t id,Testing::nbSamples_t nb, q15_t* data)  in DumpPattern_q15()
838            Testing::nbSamples_t i=0;  in DumpPattern_q15()
851     void FPGA::DumpPattern_q7(Testing::outputID_t id,Testing::nbSamples_t nb, q7_t* data)  in DumpPattern_q7()
857             Testing::nbSamples_t i=0;  in DumpPattern_q7()
870     void FPGA::DumpPattern_u64(Testing::outputID_t id,Testing::nbSamples_t nb, uint64_t* data)  in DumpPattern_u64()
876            Testing::nbSamples_t i=0;  in DumpPattern_u64()
894     void FPGA::DumpPattern_u32(Testing::outputID_t id,Testing::nbSamples_t nb, uint32_t* data)  in DumpPattern_u32()
900            Testing::nbSamples_t i=0;  in DumpPattern_u32()
913     void FPGA::DumpPattern_u16(Testing::outputID_t id,Testing::nbSamples_t nb, uint16_t* data)  in DumpPattern_u16()
919             Testing::nbSamples_t i=0;  in DumpPattern_u16()
932     void FPGA::DumpPattern_u8(Testing::outputID_t id,Testing::nbSamples_t nb, uint8_t* data)  in DumpPattern_u8()
938             Testing::nbSamples_t i=0;  in DumpPattern_u8()
951     Testing::testID_t FPGA::CurrentTestID()  in CurrentTestID()