12 #define TEST_I2C DT_NODELABEL(test_i2c)  macro
38 DEVICE_DT_DEFINE(TEST_I2C, dev_init, NULL,
69 	zassert_equal(DEVICE_INIT_DT_GET(TEST_I2C)->dev,  in ZTEST()
70 		      DEVICE_DT_GET(TEST_I2C), NULL);  in ZTEST()
90 	zassert_equal(DEVICE_INIT_DT_GET(TEST_I2C)->init_fn.dev, dev_init);  in ZTEST()
104 	zassert_equal(init_order[1], DEV_HDL(TEST_I2C));  in ZTEST()
178 	dev = device_get_binding(DEVICE_DT_NAME(TEST_I2C));  in ZTEST()
179 	zassert_equal(dev, DEVICE_DT_GET(TEST_I2C));  in ZTEST()
190 	zassert_true(check_handle(DEV_HDL(TEST_I2C), hdls, nhdls));  in ZTEST()
206 	zassert_true((ctx.rdevs[0] == device_from_handle(DEV_HDL(TEST_I2C)))  in ZTEST()
207 		     || (ctx.rdevs[1] == device_from_handle(DEV_HDL(TEST_I2C))),  in ZTEST()
218 	zassert_true(check_handle(DEV_HDL(TEST_I2C), hdls, nhdls));  in ZTEST()
224 	zassert_true(ctx.rdevs[0] == device_from_handle(DEV_HDL(TEST_I2C)),  in ZTEST()
232 	zassert_true(check_handle(DEV_HDL(TEST_I2C), hdls, nhdls));  in ZTEST()
314 	dev = DEVICE_DT_GET(TEST_I2C);  in ZTEST()