13 uint8_t var_in_res0[DT_REG_SIZE(DT_NODELABEL(syscon))] __attribute((__section__(RES_SECT)));
15 ZTEST(syscon, test_size)  in ZTEST()  argument
17 	const struct device *const dev = DEVICE_DT_GET(DT_NODELABEL(syscon));  in ZTEST()
18 	const size_t expected_size = DT_REG_SIZE(DT_NODELABEL(syscon));  in ZTEST()
27 ZTEST(syscon, test_out_of_bounds)  in ZTEST()  argument
29 	const struct device *const dev = DEVICE_DT_GET(DT_NODELABEL(syscon));  in ZTEST()
32 	zassert_equal(syscon_read_reg(dev, DT_REG_SIZE(DT_NODELABEL(syscon)), &val), -EINVAL);  in ZTEST()
33 	zassert_equal(syscon_write_reg(dev, DT_REG_SIZE(DT_NODELABEL(syscon)), val), -EINVAL);  in ZTEST()
36 ZTEST(syscon, test_read)  in ZTEST()  argument
38 	const struct device *const dev = DEVICE_DT_GET(DT_NODELABEL(syscon));  in ZTEST()
50 ZTEST(syscon, test_write)  in ZTEST()  argument
52 	const struct device *const dev = DEVICE_DT_GET(DT_NODELABEL(syscon));  in ZTEST()
62 ZTEST_SUITE(syscon, NULL, NULL, NULL, NULL, NULL);