49 static void test_shunt_cal(struct ina237_fixture *fixture)  in test_shunt_cal()  argument
52 	double shunt_cal = 819.2e6 * fixture->current_lsb_uA * 1e-6 * fixture->rshunt_uOhms * 1e-6;  in test_shunt_cal()
54 	if (fixture->config & INA237_CFG_HIGH_PRECISION) {  in test_shunt_cal()
62 	zassert_ok(ina237_mock_get_register(fixture->mock->data, INA237_REG_CALIB,  in test_shunt_cal()
68 static void test_current(struct ina237_fixture *fixture)  in test_current()  argument
86 		double current_expected_A = fixture->current_lsb_uA * 1e-6 * current_register;  in test_current()
89 		ina237_mock_set_register(fixture->mock->data, INA237_REG_CURRENT, current_register);  in test_current()
92 		zassert_ok(sensor_sample_fetch(fixture->dev));  in test_current()
93 		zassert_ok(sensor_channel_get(fixture->dev, SENSOR_CHAN_CURRENT, &sensor_val));  in test_current()
96 		zexpect_within(current_expected_A, current_actual_A, fixture->current_lsb_uA*1e-6,  in test_current()
101 static void test_bus_voltage(struct ina237_fixture *fixture)  in test_bus_voltage()  argument
103 	zassert_not_null(fixture->mock);  in test_bus_voltage()
118 		ina237_mock_set_register(fixture->mock->data, INA237_REG_BUS_VOLT,  in test_bus_voltage()
122 		zassert_ok(sensor_sample_fetch(fixture->dev));  in test_bus_voltage()
123 		zassert_ok(sensor_channel_get(fixture->dev, SENSOR_CHAN_VOLTAGE, &sensor_val));  in test_bus_voltage()
133 static void test_power(struct ina237_fixture *fixture)  in test_power()  argument
151 		double power_expected_W = 0.2 * fixture->current_lsb_uA * 1e-6 * power_register;  in test_power()
154 		ina237_mock_set_register(fixture->mock->data, INA237_REG_POWER, power_register);  in test_power()
157 		zassert_ok(sensor_sample_fetch(fixture->dev));  in test_power()
158 		zassert_ok(sensor_channel_get(fixture->dev, SENSOR_CHAN_POWER, &sensor_val));  in test_power()
166 static void test_temperature(struct ina237_fixture *fixture)  in test_temperature()  argument
168 	zassert_not_null(fixture->mock);  in test_temperature()
185 		ina237_mock_set_register(fixture->mock->data, INA237_REG_DIETEMP,  in test_temperature()
189 		zassert_ok(sensor_sample_fetch(fixture->dev));  in test_temperature()
190 		zassert_ok(sensor_channel_get(fixture->dev, SENSOR_CHAN_DIE_TEMP, &sensor_val));  in test_temperature()
200 static void test_vshunt(struct ina237_fixture *fixture)  in test_vshunt()  argument
202 	zassert_not_null(fixture->mock);  in test_vshunt()
221 		ina237_mock_set_register(fixture->mock->data, INA237_REG_SHUNT_VOLT,  in test_vshunt()
225 		zassert_ok(sensor_sample_fetch_chan(fixture->dev, SENSOR_CHAN_VSHUNT));  in test_vshunt()
226 		zassert_ok(sensor_channel_get(fixture->dev, SENSOR_CHAN_VSHUNT, &sensor_val));  in test_vshunt()
231 		if (fixture->config & INA237_CFG_HIGH_PRECISION) {  in test_vshunt()