Lines Matching +full:6 +full:a
52 double shunt_cal = 819.2e6 * fixture->current_lsb_uA * 1e-6 * fixture->rshunt_uOhms * 1e-6; in test_shunt_cal()
86 double current_expected_A = fixture->current_lsb_uA * 1e-6 * current_register; in test_current()
96 zexpect_within(current_expected_A, current_actual_A, fixture->current_lsb_uA*1e-6, in test_current()
97 "Expected %.6f A, got %.6f A", current_expected_A, current_actual_A); in test_current()
128 zexpect_within(voltage_expected_V, voltage_actual_V, 1e-6, in test_bus_voltage()
129 "Expected %.6f A, got %.6f A", voltage_expected_V, voltage_actual_V); in test_bus_voltage()
151 double power_expected_W = 0.2 * fixture->current_lsb_uA * 1e-6 * power_register; in test_power()
161 zexpect_within(power_expected_W, power_actual_W, 1e-6, in test_power()
162 "Expected %.6f C, got %.6f C", power_expected_W, power_actual_W); in test_power()
196 "Expected %.6f A, got %.6f A", temp_expected_degC, temp_actual_degC); in test_temperature()
233 vshunt_expected_mV *= 1000 * 1.250e-6; in test_vshunt()
236 vshunt_expected_mV *= 1000 * 5e-6; in test_vshunt()
240 "For %d, Expected %.6f mV, got %.6f mV", vshunt_reg_vectors[idx], in test_vshunt()
245 /* Create a test fixture for each enabled ina237 device node */
260 /* Create a test suite for each enabled ina237 device node */