21 		(pin_voltage - 0.01f) * ((r1 + r2) / (float)r2),                                   \
22 		(pin_voltage + 0.01f) * ((r1 + r2) / (float)r2),                                   \
23 		"%f Out of Range [%f,%f] input %f, [%dmΩ, %dmΩ] "                                \
26 		(double)((pin_voltage - 0.01f) * ((r1 + r2) / (float)r2)),                         \
27 		(double)((pin_voltage + 0.01f) * ((r1 + r2) / (float)r2)), (double)pin_voltage,    \
35 		(pin_voltage - 0.01f) * ADLTC2990_MICROOHM_CONVERSION_FACTOR / r_microohms,        \
36 		(pin_voltage + 0.01f) * ADLTC2990_MICROOHM_CONVERSION_FACTOR / r_microohms,        \
37 		"%f Out of Range [%f,%f] input %f, current-resistor: %dµΩ\nCheck if the sensor " \
40 		(double)((pin_voltage - 0.001f) * ADLTC2990_MICROOHM_CONVERSION_FACTOR /           \
42 		(double)((pin_voltage + 0.001f) * ADLTC2990_MICROOHM_CONVERSION_FACTOR /           \
51 		      "expected %f, got %f", (double)expected_temperature,                         \
54 /*** TEST-SUITE: ADLTC2990 Measurement Mode 0 0***/
73 static void adltc2990_0_0_before(void *f)  in adltc2990_0_0_before()  argument
75 	struct adltc2990_0_0_fixture *fixture = f;  in adltc2990_0_0_before()
111 static void adltc2990_4_3_before(void *f)  in adltc2990_4_3_before()  argument
113 	struct adltc2990_4_3_fixture *fixture = f;  in adltc2990_4_3_before()
124 	zassert_equal(0, sensor_sample_fetch_chan(fixture->dev, SENSOR_CHAN_VOLTAGE));  in ZTEST_F()
125 	zassert_equal(0, sensor_channel_get(fixture->dev, SENSOR_CHAN_VOLTAGE, value));  in ZTEST_F()
126 	zassert_equal(0, sensor_sample_fetch_chan(fixture->dev, SENSOR_CHAN_AMBIENT_TEMP));  in ZTEST_F()
127 	zassert_equal(0, sensor_channel_get(fixture->dev, SENSOR_CHAN_AMBIENT_TEMP, value));  in ZTEST_F()
128 	zassert_equal(0, sensor_sample_fetch_chan(fixture->dev, SENSOR_CHAN_CURRENT));  in ZTEST_F()
129 	zassert_equal(0, sensor_channel_get(fixture->dev, SENSOR_CHAN_CURRENT, value));  in ZTEST_F()
151 static void adltc2990_1_3_before(void *f)  in adltc2990_1_3_before()  argument
153 	struct adltc2990_1_3_fixture *fixture = f;  in adltc2990_1_3_before()
163 	uint8_t msb = 0b00000111, lsb = 0b11010000;  in ZTEST_F()
170 	CHECK_TEMPERATURE(temp_value, 0, 125.00f, SENSOR_CHAN_DIE_TEMP);  in ZTEST_F()
172 	/*0b00011101 0b10000000 –40.0000*/  in ZTEST_F()
173 	msb = 0b00011101;  in ZTEST_F()
174 	lsb = 0b10000000;  in ZTEST_F()
179 	CHECK_TEMPERATURE(temp_value, 0, -40.00f, SENSOR_CHAN_DIE_TEMP);  in ZTEST_F()
184 	/* 0b00000001 0b10010001 +25.0625 */  in ZTEST_F()
185 	uint8_t msb = 0b00000001, lsb = 0b10010001;  in ZTEST_F()
191 	CHECK_TEMPERATURE(temp_ambient, 0, 25.06250f, SENSOR_CHAN_AMBIENT_TEMP);  in ZTEST_F()
196 	/* 0b00111100 0b01011000 +0.300 */  in ZTEST_F()
197 	uint8_t msb_reg_value = 0b00111100, lsb_reg_value = 0b01011000;  in ZTEST_F()
205 	CHECK_CURRENT(current_values, 0, 0.3f, dev_config->pins_v1_v2.pins_current_resistor);  in ZTEST_F()
207 	/* 0b00100000 0b00000000 +0.159 */  in ZTEST_F()
208 	msb_reg_value = 0b00100000, lsb_reg_value = 0b00000000;  in ZTEST_F()
211 	CHECK_CURRENT(current_values, 0, 0.159f, dev_config->pins_v1_v2.pins_current_resistor);  in ZTEST_F()
216 	uint8_t msb = 0b01100000, lsb = 0b00000000;  in ZTEST_F()
221 	msb = 0b00000010;  in ZTEST_F()
222 	lsb = 0b10001111;  in ZTEST_F()
232 	float test_value = voltage_values[0].val1 + (float)voltage_values[0].val2 / 1000000;  in ZTEST_F()
234 	zassert_between_inclusive(test_value, -0.16f, -0.159f, "Out of Range [-0.16,-0.159]%.6f",  in ZTEST_F()
238 	zassert_between_inclusive(test_value, 2.69f, 2.7f, "Out of Range [2.69, 2.7]%.6f",  in ZTEST_F()
261 static void adltc2990_5_3_before(void *f)  in adltc2990_5_3_before()  argument
263 	struct adltc2990_5_3_fixture *fixture = f;  in adltc2990_5_3_before()
272 	/*Kelvin 0b00010001 0b00010010 273.1250*/  in ZTEST_F()
273 	uint8_t msb = 0b00010001, lsb = 0b00010010;  in ZTEST_F()
280 	CHECK_TEMPERATURE(temp_value, 0, 273.1250f, SENSOR_CHAN_AMBIENT_TEMP);  in ZTEST_F()
282 	/*Kelvin 0b00001110 0b10010010 233.125*/  in ZTEST_F()
283 	msb = 0b00001110;  in ZTEST_F()
284 	lsb = 0b10010010;  in ZTEST_F()
287 	CHECK_TEMPERATURE(temp_value, 1, 233.1250f, SENSOR_CHAN_AMBIENT_TEMP);  in ZTEST_F()
292 	/*0b00011000 0b11100010 398.1250*/  in ZTEST_F()
293 	uint8_t msb = 0b00011000, lsb = 0b11100010;  in ZTEST_F()
300 	CHECK_TEMPERATURE(temp_value, 0, 398.1250f, SENSOR_CHAN_DIE_TEMP);  in ZTEST_F()
322 static void adltc2990_6_3_before(void *f)  in adltc2990_6_3_before()  argument
324 	struct adltc2990_6_3_fixture *fixture = f;  in adltc2990_6_3_before()
333 	/* 0b00111100 0b01011000 +0.300 */  in ZTEST_F()
334 	uint8_t msb_reg_value = 0b00111100, lsb_reg_value = 0b01011000;  in ZTEST_F()
342 	CHECK_CURRENT(current_values, 0, 0.3f, dev_config->pins_v1_v2.pins_current_resistor);  in ZTEST_F()
344 	/* 0b00100000 0b00000000 +0.159 */  in ZTEST_F()
345 	msb_reg_value = 0b00100000, lsb_reg_value = 0b00000000;  in ZTEST_F()
348 	CHECK_CURRENT(current_values, 1, 0.159f, dev_config->pins_v3_v4.pins_current_resistor);  in ZTEST_F()
369 static void adltc2990_7_3_before(void *f)  in adltc2990_7_3_before()  argument
371 	struct adltc2990_7_3_fixture *fixture = f;  in adltc2990_7_3_before()
386 	uint8_t is_busy = BIT(0);  in ZTEST_F()
390 	is_busy = 0;  in ZTEST_F()
392 	zassert_equal(0, sensor_sample_fetch_chan(fixture->dev, SENSOR_CHAN_ALL));  in ZTEST_F()
399 	uint8_t msb = 0b00011000, lsb = 0b11100010;  in ZTEST_F()
411 	CHECK_TEMPERATURE(die_temp_value, 0, 398.1250f, SENSOR_CHAN_DIE_TEMP);  in ZTEST_F()
416 	/* 0b00111111 0b11111111 >5 */  in ZTEST_F()
417 	uint8_t msb_reg_value = 0b00111111, lsb_reg_value = 0b11111111;  in ZTEST_F()
422 	/* 0b00101100 0b11001101 3.500 */  in ZTEST_F()
423 	msb_reg_value = 0b00101100;  in ZTEST_F()
424 	lsb_reg_value = 0b11001101;  in ZTEST_F()
428 	/* 0b00011111 0b11111111 2.500 */  in ZTEST_F()
429 	msb_reg_value = 0b00011111;  in ZTEST_F()
430 	lsb_reg_value = 0b11111111;  in ZTEST_F()
434 	/* 0b01111100 0b00101001 –0.300 */  in ZTEST_F()
435 	msb_reg_value = 0b01111100;  in ZTEST_F()
436 	lsb_reg_value = 0b00101001;  in ZTEST_F()
441 	msb_reg_value = 0b00101100;  in ZTEST_F()
442 	lsb_reg_value = 0b11001101;  in ZTEST_F()
450 	CHECK_SINGLE_ENDED_VOLTAGE(voltage_values, 0, 5.0f,  in ZTEST_F()
451 				   dev_config->pins_v1_v2.voltage_divider_resistors.v1_r1_r2[0],  in ZTEST_F()
454 	CHECK_SINGLE_ENDED_VOLTAGE(voltage_values, 1, 3.5f,  in ZTEST_F()
455 				   dev_config->pins_v1_v2.voltage_divider_resistors.v2_r1_r2[0],  in ZTEST_F()
458 	CHECK_SINGLE_ENDED_VOLTAGE(voltage_values, 2, 2.5f,  in ZTEST_F()
459 				   dev_config->pins_v3_v4.voltage_divider_resistors.v3_r1_r2[0],  in ZTEST_F()
462 	CHECK_SINGLE_ENDED_VOLTAGE(voltage_values, 3, -0.3f,  in ZTEST_F()
463 				   dev_config->pins_v3_v4.voltage_divider_resistors.v4_r1_r2[0],  in ZTEST_F()
468 	zassert_between_inclusive(test_value, 6.0, 6.1, "Out of Range [6.0,6.1] %.6f",  in ZTEST_F()
492 static void adltc2990_incorrect_before(void *f)  in adltc2990_incorrect_before()  argument
494 	struct adltc2990_incorrect_fixture *fixture = f;  in adltc2990_incorrect_before()