20 int single_sector_test(const struct device *flash_dev)  in single_sector_test()  argument
38 	rc = flash_erase(flash_dev, SPI_FLASH_TEST_REGION_OFFSET,  in single_sector_test()
49 	rc = flash_write(flash_dev, SPI_FLASH_TEST_REGION_OFFSET, expected, len);  in single_sector_test()
56 	rc = flash_read(flash_dev, SPI_FLASH_TEST_REGION_OFFSET, buf, len);  in single_sector_test()
82 int multi_sector_test(const struct device *flash_dev)  in multi_sector_test()  argument
102 	rc = flash_erase(flash_dev, SPI_FLASH_TEST_REGION_OFFSET, SPI_FLASH_SECTOR_SIZE * 2);  in multi_sector_test()
111 			rc = flash_read(flash_dev, offs, buf, len);  in multi_sector_test()
132 		rc = flash_write(flash_dev, offs, expected, len);  in multi_sector_test()
139 		rc = flash_read(flash_dev, offs, buf, len);  in multi_sector_test()
169 	const struct device *flash_dev = DEVICE_DT_GET(DT_ALIAS(flash0));  in main()  local
171 	if (!device_is_ready(flash_dev)) {  in main()
172 		printk("%s: device not ready.\n", flash_dev->name);  in main()
176 	printf("\n%s SPI flash testing\n", flash_dev->name);  in main()
179 	if (single_sector_test(flash_dev)) {  in main()
183 	if (multi_sector_test(flash_dev)) {  in main()