80 void single_sector_test(const struct device *flash_dev)  in single_sector_test()  argument
102 	rc = flash_erase(flash_dev, SPI_FLASH_TEST_REGION_OFFSET,  in single_sector_test()
109 		rc = flash_read(flash_dev, SPI_FLASH_TEST_REGION_OFFSET, buf, len);  in single_sector_test()
124 	rc = flash_write(flash_dev, SPI_FLASH_TEST_REGION_OFFSET, expected, len);  in single_sector_test()
131 	rc = flash_read(flash_dev, SPI_FLASH_TEST_REGION_OFFSET, buf, len);  in single_sector_test()
156 void multi_sector_test(const struct device *flash_dev)  in multi_sector_test()  argument
180 	rc = flash_erase(flash_dev, SPI_FLASH_TEST_REGION_OFFSET, SPI_FLASH_SECTOR_SIZE * 2);  in multi_sector_test()
189 			rc = flash_read(flash_dev, offs, buf, len);  in multi_sector_test()
210 		rc = flash_write(flash_dev, offs, expected, len);  in multi_sector_test()
217 		rc = flash_read(flash_dev, offs, buf, len);  in multi_sector_test()
246 	const struct device *flash_dev = DEVICE_DT_GET_ONE(SPI_FLASH_COMPAT);  in main()  local
248 	if (!device_is_ready(flash_dev)) {  in main()
249 		printk("%s: device not ready.\n", flash_dev->name);  in main()
253 	printf("\n%s SPI flash testing\n", flash_dev->name);  in main()
256 	single_sector_test(flash_dev);  in main()
258 	multi_sector_test(flash_dev);  in main()