103 	struct abx500_bm_data *bm;  member
155 	if (di->bm->adc_therm == ABx500_ADC_THERM_BATCTRL) {  in ab8500_btemp_batctrl_volt_to_res()
161 		       - di->bm->gnd_lift_resistance * inst_curr)  in ab8500_btemp_batctrl_volt_to_res()
217 	if (di->bm->adc_therm == ABx500_ADC_THERM_BATCTRL && enable) {  in ab8500_btemp_curr_source_enable()
250 	} else if (di->bm->adc_therm == ABx500_ADC_THERM_BATCTRL && !enable) {  in ab8500_btemp_curr_source_enable()
465 	id = di->bm->batt_id;  in ab8500_btemp_measure_temp()
467 	if (di->bm->adc_therm == ABx500_ADC_THERM_BATCTRL &&  in ab8500_btemp_measure_temp()
482 			di->bm->bat_type[id].r_to_t_tbl,  in ab8500_btemp_measure_temp()
483 			di->bm->bat_type[id].n_temp_tbl_elements, rbat);  in ab8500_btemp_measure_temp()
499 			di->bm->bat_type[id].r_to_t_tbl,  in ab8500_btemp_measure_temp()
500 			di->bm->bat_type[id].n_temp_tbl_elements, rntc);  in ab8500_btemp_measure_temp()
521 	di->bm->batt_id = BATTERY_UNKNOWN;  in ab8500_btemp_id()
530 	for (i = BATTERY_UNKNOWN + 1; i < di->bm->n_btypes; i++) {  in ab8500_btemp_id()
531 		if ((res <= di->bm->bat_type[i].resis_high) &&  in ab8500_btemp_id()
532 			(res >= di->bm->bat_type[i].resis_low)) {  in ab8500_btemp_id()
536 				di->bm->adc_therm == ABx500_ADC_THERM_BATCTRL ?  in ab8500_btemp_id()
538 				di->bm->bat_type[i].resis_low, res,  in ab8500_btemp_id()
539 				di->bm->bat_type[i].resis_high, i);  in ab8500_btemp_id()
541 			di->bm->batt_id = i;  in ab8500_btemp_id()
546 	if (di->bm->batt_id == BATTERY_UNKNOWN) {  in ab8500_btemp_id()
556 	if (di->bm->adc_therm == ABx500_ADC_THERM_BATCTRL &&  in ab8500_btemp_id()
557 	    di->bm->batt_id == 1) {  in ab8500_btemp_id()
562 	return di->bm->batt_id;  in ab8500_btemp_id()
607 		interval = di->bm->temp_interval_chg;  in ab8500_btemp_periodic_work()
609 		interval = di->bm->temp_interval_nochg;  in ab8500_btemp_periodic_work()
836 		val->intval = di->bm->bat_type[di->bm->batt_id].name;  in ab8500_btemp_get_property()
1016 	di->bm = plat;  in ab8500_btemp_probe()
1019 		ret = ab8500_bm_of_probe(&pdev->dev, np, di->bm);  in ab8500_btemp_probe()